16 Oct 2023
Microscopic Characterization of 2D Materials by Spectroscopic Imaging Ellipsometry
maging ellipsometry, combines
the power of ellipsometry with
optical microscopy. It achieves
the highest lateral resolution in the
field of ellipsometry and offers a
very sensitive imaging technology
for thin films. Typical samples
range from tiny samples like flakes
of 2D materials to inhomogeneous
surfaces like some CWD samples
of 2D materials or terraces at
Epitaxial Graphene surfaces.