-
TemperatureControl Nanopattern PVAC Layer PolymerBlend polyvinyl acetate Pipette Polydimethylsiloxane PatternedSapphireSubstrat CarbonNanotube SurfaceOxidation LateralPFM small_scan IMT_Bucharest Fendb HexagonalBoronNitride molecules FuelCell OrganicCompound ScanningThermalMicroscopy AIN ConductingPolymer semifluorinated_alkanes Deposition Aluminum ThermalDetectors PhaseTransition Hexacontane TPU AlkaneFilm Dimethicone Perovskite PiezoelectricForceMicroscopy FailureAnlaysis 2dMaterials
Report image
If you found this image unacceptable, please let us know. We will review your report and take action if we determine this image is really unacceptable.
Semiconductor device, W-plug
Scanning Conditions
- System: NX10
- Scan Mode: Conductive AFM
- Cantilever: ElectriMulti75-G (k=3N/m, f=75kHz)
- Scan Size: 2μm×1μm
- Scan Rate: 0.3Hz
- Pixel: 512×256
- Sample bias: +1V