News
28, May 14'
Press-Release
Park NX-PTR AFM Nanometrology Pole Tip Recession (PTR) measurements for inline HDD slider
"Park Systems trademark AFM line demonstrates the accuracy and reliabilit...
18
May 2014'
Newsletters
Q2 2014
EVENTS
2014 International Conference on Nanoscience ...
22, Apr 14'
Press-Release
Dr. Sang-il Park, CEO & Founder Park Systems
“We have become the leader in nanotechnology design by constantly outperforming our competition, and creating ways to ...
20
Apr 2014'
Newsletters
Park Systems Inc Newsletter - Q2, 2014
Contents
• Message from President• Spotlight on Employee• Park Systems CEO Dr. Sang-il Park Presenter at MRS Spr...
2, Apr 14'
Press-Release
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully aut...
7, Mar 14'
Press-Release
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technol...
25, Feb 14'
Park in the News
14, Feb 14'
Press-Release
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida Internatio...