- Magnetic Nanoscavengers: The New Trend to Improve Water Qualit
- Contact AFM Nanolithography Based on Anodic Oxidation
- High resolution imaging of single PTFE molecules on Teflon surface
- Application-specific characterizations and analyses of carbon-based materials utilizing different microscopic technologies
- Improved Electrical Characterization of Advanced Materials in High Vacuum Environment
- Quantifying Epitaxial Growth using a Purely Topographical Signal
- A Comparative Study of Atomic Force Microscopy between AM-KPFM and Sideband KPFM
帕克科学仪器杂志-纳米科学
LINK 1: 纳米科学杂志2021年冬季版
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