Contact Sign In
Company
About Us
Park Systems Corporation is the global leader in nanoscale microscopy and metrology Solutions.
Brochure Investor Inquiries
Park Systems Corporation
Edit Component
Our comprehensive portfolio features cutting-edge technologies, including atomic force microscopy (AFM) with proprietary True Non-Contact™ imaging, white light interferometry (WLI) for nanometer-scale surface analysis, nano-infrared spectroscopy (nano-IR) for chemical characterization, imaging spectroscopic ellipsometry (ISE) for thin film measurement, and digital holographic microscopy (DHM) for advanced 3D profiling.​

At the forefront of innovation, Park Systems has redefined nanoscale measurement through groundbreaking developments such as high-precision 3D metrology systems and fully automated AFM solutions, all engineered to meet the exacting requirements of both cutting-edge research and high-volume industrial applications.

Our advanced technologies empower critical applications across multiple industries, including scientific research, nanoscale engineering, semiconductor fabrication, display manufacturing process control, advanced packaging, and precision quality assurance.

​ Today, we proudly support global semiconductor leaders, top-tier academic institutions, and premier national laboratories—delivering the accuracy, reliability, and innovation that propel progress at the nanoscale.​
Edit Component