Tuesday, May 19th
Speaker: Dr. James Kerfoot, Application Scientist, Park Systems United Kingdom
Discover how automated AFM accelerates nanoscale research on layered materials. This webinar demonstrates how the FX200 AFM automatically switches probes and modes to capture high-resolution data across multiple samples. Learn how techniques such as NCM, LFM, and C-AFM reveal moiré patterns and enable faster materials discovery.
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Tuesday, May 26th
Speaker: John Park, RE Application Technology Team, Park Systems Corporation
Gain a foundational understanding of Nano-IR, from core operating principles to key measurement modes. This session provides practical insights to help researchers confidently interpret data and apply Nano-IR in real-world workflows. Join this upcoming session to deepen your expertise in nanoscale chemical analysis and expand your practical understanding of Nano-IR.
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Monday, June 8th
Speaker: Luna Kim, RE Application Technology Team, Park Systems Corporation
Explore the fundamentals of Nano-IR and how different measurement modes impact data quality and interpretation. This webinar delivers a clear, practical framework for applying Nano-IR in advanced materials research and analytical workflows. Join this expert-led session to expand your nanoscale chemical analysis capabilities and gain actionable insights you can apply in your research.