Name: EFM-100
Brand: Park Systems
Availability: InStoreOnly

Nano Standard Samples

EFM Characterizer (EFM-100)

The EFM characterizer, EFM-100 is a standard to measure the electrostatic force between the charged AFM tip and the sample surface.

Manufactured by Kims Reference Corp. (internationally accredited reference materials producer from ILAC-MRA and KOLAS via ISO-17034)

Quotation

Specifications

Pitch: 6 μm
Line width: 2.5 μm
Step height: 20 nm
Electrode material: Cr / Au
Substrate: Circular coupon (Ф 20 mm)
Traceability: Not certified

Applications

EFM-100 can be used to check the non-potentiometric dielectric properties of the sample surface, and to image the electrostatic force at the nanoscale level. In the EFM measurement mode, Z-height, EFM Amplitude, EFM Phase, and EFM Quad items can be measured.